Proceedings of the 8th International Conference on the Physics of Highly Charged Ions, Omiya, Saitama, Japan, September 23-26, 1996

Proceedings of the 8th International Conference on the Physics of Highly Charged Ions, Omiya, Saitama, Japan, September 23-26, 1996

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Schematic of the beam lines on the JPL Caprice multiply-charged ion source. (Ll- LS) three-element focusing lenses, (B) differential pumping baffle, (D) deflector plates, (MP) merging trochoidal plates, (AP) electron analyzing trochoidal plates, anbsp;...


Title:Proceedings of the 8th International Conference on the Physics of Highly Charged Ions, Omiya, Saitama, Japan, September 23-26, 1996
Author: Yohko Awaya, Tadashi Kambara
Publisher: - 1997
ISBN-13:

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